F. Saigné

Publication Activity (10 Years)

Years Active: 2001-2003
Publications (10 Years): 0

Publications

D. Zander, F. Saigné, A. Meinertzhagen, C. Petit
Contribution of oxide traps on defect creation and LVSILC conduction in ultra thin gate oxide devices. Microelectron. Reliab. 43 (9-11) (2003)
F. Saigné, Olivier Quittard, Laurent Dusseau, F. Joffre, Coumar Oudéa, J. Fesquet, Jean Gasiot
Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. Microelectron. Reliab. 42 (3) (2002)
D. Zander, F. Saigné, A. Meinertzhagen
Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides. Microelectron. Reliab. 41 (9-10) (2001)
D. Zander, C. Petit, F. Saigné, A. Meinertzhagen
High field stress at and above room temperature in 2.3 nm thick oxides. Microelectron. Reliab. 41 (7) (2001)