TRACKING FRAMEWORK
Experts
- Petar M. Djuric
- Lyudmila Mihaylova
- Branko Ristic
- Huchuan Lu
- Andrea Cavallaro
- Marcelo G. S. Bruno
- Changhong Fu
- Fasheng Wang
- Martin Danelljan
- Joaquín Míguez
- Mónica F. Bugallo
- Yonggang Zhang
- Bogdan Kwolek
- Yaakov Bar-Shalom
- Weiming Hu
- Fahad Shahbaz Khan
- Namrata Vaswani
- Hanzi Wang
- Haibin Ling
- Jean-Marc Odobez
- Allen R. Tannenbaum
- Jonathon A. Chambers
- Peter Willett
- Michael Felsberg
- Xionghu Zhong
- Simon J. Godsill
- Zhenyu He
- Qingjie Zhao
- Amadou Gning
- Shin Ishii
- Dan Schonfeld
- Shengjin Wang
- Jordi Gonzàlez
- Masatoshi Ishikawa
- Rama Chellappa
- Pau Closas
- Warren E. Dixon
- Roberto Cipolla
- Jesús Martínez del Rincón
Venues
- CoRR
- FUSION
- ICASSP
- Sensors
- IEEE Access
- ICIP
- CVPR
- ICRA
- ACC
- IROS
- CDC
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Signal Process.
- ICPR
- EUSIPCO
- Neurocomputing
- Signal Process.
- ICCV
- IEEE Trans. Image Process.
- Multim. Tools Appl.
- IEEE Trans. Autom. Control.
- IEEE Trans. Circuits Syst. Video Technol.
- Pattern Recognit.
- CVPR Workshops
- Image Vis. Comput.
- IEEE Trans. Control. Syst. Technol.
- Autom.
- Mach. Vis. Appl.
- BMVC
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICME
- AVSS
- IEEE Signal Process. Lett.
- EMBC
- IEEE Trans. Ind. Electron.
- SMC
- Pattern Recognit. Lett.
- EURASIP J. Adv. Signal Process.
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