SURFACE CURVATURE
Experts
- Jörg Peters
- Kestutis Karciauskas
- Katsushi Ikeuchi
- Jonathan Kelly
- Kenjiro T. Miura
- Valentin Peretroukhin
- Gershon Elber
- Jiantao Jiao
- Nic Lupfer
- Rida T. Farouki
- Timothy S. Newman
- Hui Chen
- Andrew M. Webb
- Daniel Barath
- Marc Alexa
- Martial Hebert
- Reinhard Klette
- Chang-Hun Kim
- Nasser Khalili
- Lawrence B. Wolff
- Daniel T. L. Lee
- Bir Bhanu
- Robert J. Woodham
- Helmut Pottmann
- Hiromi T. Tanaka
- Zhe Yu Liu
- Xiaoping Wang
- Charlie C. L. Wang
- Patrick J. Flynn
- Marc Pollefeys
- Holger Theisel
- Peter Yuen
- Bikash Sabata
- Jean-Claude Léon
- Farzin Mokhtarian
- Andruid Kerne
- Kim L. Boyer
- Banghua Zhu
- Ya-Liang Chang
Venues
- CoRR
- Comput. Aided Des.
- Comput. Aided Geom. Des.
- CVPR
- ICRA
- ICCV
- Comput. Graph. Forum
- Comput. Vis. Image Underst.
- Comput. Graph.
- Sensors
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- Vis. Comput.
- ACC
- IROS
- ACM Trans. Graph.
- Comput. Stat. Data Anal.
- Symposium on Solid Modeling and Applications
- 3DIM
- Appl. Math. Comput.
- ICPR (1)
- SIGGRAPH
- IEEE Visualization
- IEEE Trans. Geosci. Remote. Sens.
- ITSC
- ICPR
- Symmetry
- Comput. Vis. Graph. Image Process.
- CAD/Graphics
- ICASSP
- Int. J. Comput. Vis.
- J. Comput. Chem.
- EUSIPCO
- IEEE Computer Graphics and Applications
- IEEE Trans. Signal Process.
- MVA
- IGARSS
- CDC
- Comput. Math. Appl.
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