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Experts
- Abdelhak M. Zoubir
- H. Vincent Poor
- Frédéric Pascal
- Jean Philippe Ovarlez
- András Edelmayer
- Brandon Wagstaff
- Nenghai Yu
- Stavros D. Nikolopoulos
- Helin Wang
- Iosif Polenakis
- Mark D. Plumbley
- Yuexian Zou
- Enkelejda Kasneci
- Samuel Dilshan Somasundaram
- John B. Thomas
- Andreas Jakobsson
- Michael Fauß
- Jun Liu
- K. Sreenivasa Rao
- Dongchao Yang
- Changming Sun
- Jonathan Kelly
- Weihai Li
- Wenyi Zhang
- Victor Golikov
- Di Jin
- Min Tan
- Philip H. S. Torr
- Christophe Marsala
- John A. S. Smith
- Iris Hui-Ru Jiang
- Lianwen Jin
- Cyrill Stachniss
- Danilo Cáceres Hernández
- Robyn A. Owens
- Michael Unser
- Naveed R. Butt
- Björn W. Schuller
- Peter Veelaert
Venues
- CoRR
- Sensors
- IEEE Access
- ICASSP
- Multim. Tools Appl.
- IEEE Trans. Inf. Theory
- EUSIPCO
- INTERSPEECH
- EMBC
- Pattern Recognit. Lett.
- ICPR
- IEEE Trans. Instrum. Meas.
- Comput. Electron. Agric.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- IROS
- Expert Syst. Appl.
- FUSION
- ITSC
- Neurocomputing
- CinC
- ICIP
- IEEE Trans. Signal Process.
- IGARSS
- Intelligent Vehicles Symposium
- IJCNN
- Remote. Sens.
- CVPR
- ICCV
- DAGM-Symposium
- J. Electronic Imaging
- BMC Bioinform.
- EURASIP J. Adv. Signal Process.
- Biomed. Signal Process. Control.
- ICCCNT
- IEEE Trans. Commun.
- DICTA
- IEEE Trans. Biomed. Eng.
- ICC
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