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Experts
- Marcelo G. S. Bruno
- Reza Jalil Mozhdehi
- Stiven Schwanz Dias
- Petar M. Djuric
- Lyudmila Mihaylova
- Henry Medeiros
- Amadou Gning
- Junghyun Kwon
- Joaquín Míguez
- William Ng
- Namrata Vaswani
- Claudio J. Bordin Jr.
- Juan José Pantrigo
- Ananthram Swami
- Futoshi Asano
- Allen R. Tannenbaum
- Delaram Jarchi
- I-Cheng Chang
- Zhang-Song Shi
- Josep R. Casas
- Shih-Yao Lin
- Antonio S. Montemayor
- Saeid Sanei
- Wei He
- Yongmin Zhong
- Nicholas D. Sidiropoulos
- François Septier
- Jacob Scharcanski
- Enlu Zhou
- Yi Xu
- Mark Hedley
- Fasheng Wang
- M. Sanjeev Arulampalam
- Allan De Freitas
- Huaping Liu
- Rashid Ansari
- Christelle Garnier
- Patrick Danès
- Loris Bazzani
Venues
- ICASSP
- CoRR
- Signal Process.
- FUSION
- Sensors
- IEEE Trans. Signal Process.
- ICIP
- IEEE Access
- IEEE Trans. Aerosp. Electron. Syst.
- EURASIP J. Adv. Signal Process.
- ACC
- Multim. Tools Appl.
- EUSIPCO
- IEEE Signal Process. Lett.
- ICASSP (3)
- GLOBECOM
- ICASSP (2)
- ICPHM
- IEEE Trans. Pattern Anal. Mach. Intell.
- Mach. Vis. Appl.
- IEEE Trans. Image Process.
- Robotica
- ICPR
- SIU
- Pattern Recognit. Lett.
- Autom.
- ICRA
- BMVC
- ICASSP (4)
- IEEE Trans. Instrum. Meas.
- CDC
- WPNC
- Wirel. Pers. Commun.
- ROBIO
- IEEE Trans. Veh. Technol.
- Comput. Vis. Image Underst.
- ICMC
- IET Signal Process.
- ICIA
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