INTERACTING MULTIPLE MODEL
Experts
- Henk A. P. Blom
- Yaakov Bar-Shalom
- Edwin A. Bloem
- Stefan Becker
- Wolfgang Hübner
- Hyun Myung
- Michael Arens
- Nathanael L. Baisa
- Rong Yang
- Pengfei Li
- Hamidreza Amindavar
- Yingmin Jia
- Wenling Li
- Saeid R. Habibi
- En Fan
- Leonhard M. Reindl
- Antonio Graziano
- Purang Abolmaesumi
- Alfonso Farina
- Masaya Murata
- Xiaohong Su
- Shunguang Wu
- R. Torelli
- Tom L. Koller
- Futao Zhang
- Lingjiang Kong
- Udo Frese
- Assimakis K. Leros
- Behzad Akbari
- Thiagalingam Kirubarajan
- Chongzhao Han
- Fethi Candan
- Xiaolong Zhou
- Haibin Zhu
- Chin-Teng Lin
- Hui Ye
- Hao Zhang
- Xiaolong Li
- Ratnasingham Tharmarasa
Venues
- IEEE Access
- Sensors
- FUSION
- CoRR
- Signal Process.
- CDC
- ACC
- Digit. Signal Process.
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Signal Process.
- ICASSP
- ICRA
- IEEE Trans. Instrum. Meas.
- IEEE Signal Process. Lett.
- IEEE Trans. Veh. Technol.
- IROS
- FUZZ-IEEE
- ICIP
- Remote. Sens.
- SMC
- Multim. Tools Appl.
- ICIA
- IEEE Trans. Intell. Transp. Syst.
- IET Signal Process.
- IGARSS
- Circuits Syst. Signal Process.
- Int. J. Syst. Sci.
- ICPR (2)
- IEEE Trans. Geosci. Remote. Sens.
- J. Frankl. Inst.
- ICCAIS
- IEEE Trans. Ind. Electron.
- Appl. Intell.
- J. Intell. Robotic Syst.
- Adv. Robotics
- Eur. J. Control
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- ICPR
- EURASIP J. Adv. Signal Process.
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