INDUSTRIAL PARTS
Experts
- Saburo Tsuji
- Peigen Li
- Yuxiang Yang
- TaiFeng Li
- Quan-Ke Pan
- Masahiko Yachida
- Mingyu Gao
- Linda G. Shapiro
- Liang Gao
- Zhiwei He
- Soonjo Kwon
- W. A. Perkins
- Tien C. Hsia
- Tamio Arai
- Thorsten Theobald
- Max A. Little
- Leonardo Fernández-Jambrina
- Xilong Liu
- Zhigang Zhu
- Toshiaki Yoshino
- Zhenhua Xiong
- Joost J. C. Verhoeff
- Yordan P. Raykov
- Matthias Nießner
- Stefan Popov
- Wei Wen
- Mariofanna G. Milanova
- Kevis-Kokitsi Maninis
- Dmitry Yukhimets
- Christoph M. Hoffmann
- J. A. D. W. Anderson
- Jaime S. Cardoso
- Vittorio Ferrari
- Tegoeh Tjahjowidodo
- Xiao Li
- David García
- José M. Sebastián
- Andrei Lozzi
- Christoph Meinel
Venues
- CoRR
- Sensors
- ICRA
- Comput. Aided Des.
- IROS
- ICCAD
- MVA
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Robotics Auton. Syst.
- Remote. Sens.
- J. Intell. Robotic Syst.
- DAC
- ICPR
- AIM
- BMVC
- Comput. Graph.
- CASE
- M2VIP
- SIGGRAPH
- Mach. Vis. Appl.
- ICPR (1)
- IEEE Des. Test
- ROBIO
- J. Comput.
- Comput. Ind.
- Image Vis. Comput.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IJCAI
- ISBI
- J. Comput. Inf. Sci. Eng.
- Int. J. Comput. Integr. Manuf.
- J. Sensors
- FMCAD
- J. Robotics Mechatronics
- CAD/Graphics
- EMBC
- Proc. IEEE
- ICIP
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