IEEE Des. Test

Publications

volume 41, number 1, 2024

Axel Jantsch, Swaroop Ghosh, Ümit Y. Ogras, Pascal Meinerzhagen
ISLPED 2023: International Symposium on Low-Power Electronics and Design. IEEE Des. Test 41 (1) (2024)
Rob Munoz
Furthering Moore's Law Integration Benefits in the Chiplet Era. IEEE Des. Test 41 (1) (2024)
Kyonghwan Yoon, Eunjin Jeong, Woosuk Kang, Soonhoi Ha
Memory Usage Estimation for Dataflow-Model-Based Software Development Methodology. IEEE Des. Test 41 (1) (2024)
Scott Davidson
Losing My Memory. IEEE Des. Test 41 (1) (2024)
Sudeep Pasricha, Marilyn Wolf
Special Issue on Ethics in Computing. IEEE Des. Test 41 (1) (2024)
Sudeep Pasricha, Marilyn Wolf
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence. IEEE Des. Test 41 (1) (2024)
Sayed Ahmad Salehi
Area-Efficient LFSR-Based Stochastic Number Generators With Minimum Correlation. IEEE Des. Test 41 (1) (2024)
Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno van der Maas, Matthew Naylor, Michael Roe, Robert N. M. Watson, Peter G. Neumann, Simon W. Moore
Randomized Testing of RISC-V CPUs Using Direct Instruction Injection. IEEE Des. Test 41 (1) (2024)
Cullen E. Bash, Kirk Bresniker, Paolo Faraboschi, Tiffani Jarnigan, Dejan S. Milojicic, Pam Wood
Ethics in Sustainability. IEEE Des. Test 41 (1) (2024)
Anish Krishnakumar, Hanguang Yu, Tutu Ajayi, A. Alper Goksoy, Vishrut Pandey, Joshua Mack, Md Sahil Hassan, Kuan-Yu Chen, Chaitali Chakrabarti, Daniel W. Bliss, Ali Akoglu, Hun-Seok Kim, Ronald G. Dreslinski, David T. Blaauw, Ümit Y. Ogras
FALCON: An FPGA Emulation Platform for Domain-Specific SoCs (DSSoCs). IEEE Des. Test 41 (1) (2024)
Naghmeh Karimi
The 28th IEEE European Test Symposium. IEEE Des. Test 41 (1) (2024)
Craig Partridge, Moti Gorin, Eric Easley, Jesse Gray
Five Years Teaching Ethics and Computing. IEEE Des. Test 41 (1) (2024)
Philip Koopman, William H. Widen
Safety Ethics for Design and Test of Automated Driving Features. IEEE Des. Test 41 (1) (2024)
Partha Pratim Pande
Ethics in Computing. IEEE Des. Test 41 (1) (2024)

volume 41, number 2, 2024

volume 41, number 3, 2024

volume 41, number 4, 2024

Mridha Md Mashahedur Rahman, Shams Tarek, Kimia Zamiri Azar, Mark M. Tehranipoor, Farimah Farahmandi
Efficient SoC Security Monitoring: Quality Attributes and Potential Solutions. IEEE Des. Test 41 (4) (2024)
Scott Davidson
IC Phone Home! IEEE Des. Test 41 (4) (2024)
Fei Su, Robert Kwasnick, John Holm, William Penner, Hermann Gartler, Josh Boelter, Yufei Zhou, Bijan Arbab, Michael Rothberg
Product Health Insights Using Telemetry. IEEE Des. Test 41 (4) (2024)
Partha Pratim Pande
Silicon Lifecycle Management. IEEE Des. Test 41 (4) (2024)
Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich
Workload-Aware Periodic Interconnect BIST. IEEE Des. Test 41 (4) (2024)
Mehdi Baradaran Tahoori, Yervant Zorian
Special Issue on Silicon Lifecycle Management. IEEE Des. Test 41 (4) (2024)
Caio Batista de Melo, Marzieh Ashrafiamiri, Minjun Seo, Fadi J. Kurdahi, Nikil D. Dutt
SAFER: Safety Assurances for Emergent Behavior. IEEE Des. Test 41 (4) (2024)
Muhammad Monir Hossain, Kimia Zamiri Azar, Fahim Rahman, Farimah Farahmandi, Mark M. Tehranipoor
Fuzzing for Automated SoC Security Verification: Challenges and Solution. IEEE Des. Test 41 (4) (2024)
Janusz Rajski, Vivek Chickermane, Jean-François Côté, Stephan Eggersglüß, Nilanjan Mukherjee, Jerzy Tyszer
The Future of Design for Test and Silicon Lifecycle Management. IEEE Des. Test 41 (4) (2024)
Nicola Nicolici
Interview With Janusz Rajski. IEEE Des. Test 41 (4) (2024)

volume 40, number 6, 2023