FAULT DETECTION AND DIAGNOSIS
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Jong-Myon Kim
- Steven X. Ding
- Khashayar Khorasani
- Mohamed N. Nounou
- Majdi Mansouri
- Hazem N. Nounou
- Bin Jiang
- Krishnendu Chakrabarty
- Xuefeng Chen
- Ruqiang Yan
- Marios M. Polycarpou
- Hiroshi Takahashi
- Zhongkui Zhu
- Mehrdad Saif
- Silvio Simani
- Fengshou Gu
- Nader Meskin
- Andrew D. Ball
- Weihua Li
- Krishna R. Pattipati
- Jose A. Antonino-Daviu
- Chuan Li
- Thomas Parisini
- Haidong Shao
- Vicenç Puig
- Janusz Rajski
- Donghua Zhou
- Changqing Shen
- Shen Yin
- Pabitra Mohan Khilar
- Xiao He
- Yuzo Takamatsu
- Guang-Hong Yang
- Maiying Zhong
- Weiguo Huang
- Mourad Elhadef
- Yigang He
Venues
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Sensors
- IEEE Trans. Ind. Electron.
- CoRR
- ACC
- IEEE Trans. Ind. Informatics
- IECON
- Expert Syst. Appl.
- CDC
- Eng. Appl. Artif. Intell.
- IEEE Trans. Computers
- ECC
- Autom.
- Neurocomputing
- Entropy
- ITC
- IEEE Trans. Autom. Control.
- Reliab. Eng. Syst. Saf.
- SMC
- Knowl. Based Syst.
- IEEE Trans. Control. Syst. Technol.
- Adv. Eng. Informatics
- Appl. Soft Comput.
- J. Frankl. Inst.
- Comput. Chem. Eng.
- CAA SAFEPROCESS
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- I2MTC
- IAS
- J. Intell. Fuzzy Syst.
- Neural Comput. Appl.
- Int. J. Syst. Sci.
- VTS
- Asian Test Symposium
- J. Electron. Test.
- ICPHM
- IJCNN
- ISIE
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