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Hierarchical test generation under architectural level functional constraints.

Jaushin LeeJanak H. Patel
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
  • test generation
  • test sequences
  • static analysis
  • symbolic execution
  • test cases
  • quality assurance
  • design automation
  • computer vision
  • databases
  • real world
  • high level
  • cooperative