BIST Test Pattern Generators for Two-Pattern Testing-Theory and Design Algorithms.
Chih-Ang ChenSandeep K. GuptaPublished in: IEEE Trans. Computers (1996)
Keyphrases
- pattern matching
- candidate patterns
- learning algorithm
- pattern matching algorithm
- experimental design
- test data
- optimization problems
- user interface
- theoretical framework
- computational complexity
- efficient implementation
- post hoc
- computational cost
- genetic algorithm
- case study
- mathematical foundations
- data structure
- design decisions
- statistical tests
- pattern discovery
- black box
- software architecture
- test cases
- benchmark datasets
- design process
- theoretical analysis
- significant improvement