New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters.
Eduardo J. PeralíasAdoración RuedaJosé Luis HuertasPublished in: J. Electron. Test. (2001)
Keyphrases
- circuit design
- mixed signal
- printed circuit
- data conversion
- delta sigma
- sigma delta
- multi channel
- test cases
- structural information
- data flow
- real time
- digital technologies
- analog to digital converter
- analog vlsi
- vlsi architecture
- analog circuits
- digital media
- software testing
- test data
- case study
- information retrieval
- databases