Enhanced Interconnect Test Method for Resistive Open Defects in Final Tests with Relaxation Oscillators.
Masao OhmatsuYuto OhteraYuki IkiriHiroyuki YotsuyanagiShyue-Kung LuMasaki HashizumePublished in: ATS (2022)
Keyphrases
- test data
- cost function
- high precision
- test cases
- pairwise
- experimental evaluation
- detection method
- fully automatic
- significant improvement
- dynamic programming
- computationally efficient
- edge detection
- classification method
- computational cost
- computational complexity
- objective function
- optimization method
- segmentation method
- synthetic data
- learning algorithm
- clustering method
- theoretical analysis
- mutual information
- high accuracy
- prior knowledge
- multiscale
- image segmentation
- decision trees