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Failure and reliability analysis of STT-MRAM.

Weisheng ZhaoYue ZhangThibaut DevolderJacques-Olivier KleinDafine RavelosonaClaude ChappertPascale Mazoyer
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • reliability analysis
  • design considerations
  • random access memory
  • machine learning
  • rough sets
  • particle swarm optimization
  • condition monitoring
  • fault tree