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Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements.

Felice CrupiMassimo AliotoJacopo FrancoPaolo MagnoneMitsuhiro TogoN. HoriguchiGuido Groeseneken
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2012)
Keyphrases
  • logic circuits
  • low power
  • functional decomposition
  • measurement data
  • tunnel diode
  • real time
  • high speed
  • parallel algorithm
  • boolean functions