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Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects.

Xrysovalantis KavousianosKrishnendu Chakrabarty
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2011)
Keyphrases
  • test set
  • error rate
  • training data
  • training set
  • test data
  • test cases
  • evaluation methodology
  • random selection
  • neural network
  • genetic algorithm
  • learning algorithm
  • adaptive neural