Test generation for sequentiel logic circuits using petri nets.
Iwan TabakowPublished in: Bull. dInformatique Approfondie et Appl. (1994)
Keyphrases
- petri net
- test generation
- logic circuits
- low power
- test cases
- petri net model
- manufacturing systems
- low cost
- static analysis
- discrete event systems
- tunnel diode
- quality assurance
- colored petri nets
- stochastic petri net
- software testing
- quality control
- image processing
- power dissipation
- regression testing
- power consumption
- high speed
- relational databases
- fuzzy petri net
- case study