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A parallel sequential test generation system DESCARTES based on real-valued logic simulation.

Hiroshi DateMichinobu NakaoKazumi Hatayama
Published in: Asian Test Symposium (1995)
Keyphrases
  • real valued
  • test generation
  • test cases
  • complex valued
  • design automation
  • integer valued
  • latent variables
  • software testing
  • high level
  • training set
  • static analysis
  • quality assurance
  • real valued data