Proofs: A Fast, Memory Efficient Sequential Circuit Fault Simulator.
Thomas M. NiermannWu-Tung ChengJanak H. PatelPublished in: DAC (1990)
Keyphrases
- memory efficient
- fault diagnosis
- fault detection
- external memory
- analog circuits
- multiple sequence alignment
- mathematical proofs
- formal proof
- simulation model
- test bed
- high speed
- short circuit
- circuit design
- iterative deepening
- neural network
- theorem proving
- theorem prover
- digital circuits
- natural deduction
- equational theories