Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution.
Hiroshi MakinoShunji NakataHirotsugu SuzukiShin'ichiro MutohMasayuki MiyamaTsutomu YoshimuraShuhei IwadeYoshio MatsudaPublished in: IEEE Trans. Circuits Syst. II Express Briefs (2011)