Sequential Circuit Test Generation Using a Symbolic/Genetic Hybrid Approach.
Franco FummiMarco BoschiniXiaoming YuElizabeth M. RudnickPublished in: J. Electron. Test. (2001)
Keyphrases
- test generation
- test cases
- test sequences
- symbolic execution
- design automation
- static analysis
- quality assurance
- genetic linkage
- genetic algorithm
- high speed
- software testing
- mutation testing
- linkage analysis
- source code
- circuit design
- high level
- symbolic representation
- pattern matching
- open source
- case study
- databases