Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach.
Jianlei YangPeiyuan WangYaojun ZhangYuanqing ChengWeisheng ZhaoYiran ChenHai (Helen) LiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
- error analysis
- semiconductor devices
- least squares
- design considerations
- cross ratio
- x ray
- high speed
- infrared
- error correction
- circuit design
- equivalent circuit
- field effect transistors
- digital circuits
- electron beam
- analog circuits
- low voltage
- steady state
- electronic circuits
- machine learning
- random access memory
- mobile devices