A Comprehensive Fault Model for Deep Submicron Digital Circuits.
Jacob A. AbrahamArun KrishnamacharyRaghuram S. TupuriPublished in: DELTA (2002)
Keyphrases
- digital circuits
- fault model
- model based diagnosis
- mixed signal
- safety analysis
- fault injection
- vlsi circuits
- data flow
- circuit design
- electron beam
- fault models
- dynamic systems
- constraint programming
- functional decomposition
- low power
- relational databases
- database systems
- decision diagrams
- low cost
- control system
- databases