Monitoring industrial processes with SOM-based dissimilarity maps.
Manuel Domínguez-GonzálezJuan J. Fuertes-MartínezIgnacio Díaz BlancoMiguel A. PradaSerafín AlonsoAntonio Morán ÁlvarezPublished in: Expert Syst. Appl. (2012)
Keyphrases
- industrial processes
- industrial process
- fault detection
- quality improvement
- self organizing maps
- monitoring system
- fault detection and isolation
- neural network
- welding process
- fault detection and diagnosis
- real time
- kohonen self organizing map
- competitive learning
- dissimilarity measure
- feature maps
- quality assurance
- product quality
- fault diagnosis
- input data
- feature space
- artificial intelligence
- genetic algorithm