DISSIMILARITY MEASURE
Experts
- Robert P. W. Duin
- Edwin R. Hancock
- James C. Bezdek
- János Pach
- Tomasz Kociumaka
- Eamonn J. Keogh
- Robert Krauthgamer
- Ana L. N. Fred
- Ely Porat
- Maike Buchin
- Kouichi Hirata
- Barbara Hammer
- Pawel Gawrychowski
- Sargur N. Srihari
- Swagatam Das
- Floriana Esposito
- Karl Bringmann
- Micha Sharir
- Alessia Amelio
- Francisco de A. T. de Carvalho
- Mauricio Orozco-Alzate
- Robert Sabourin
- James Bailey
- Ralf Klasing
- Elzbieta Pekalska
- Amit Konar
- Sunil Aryal
- Tatsuya Akutsu
- Jovisa D. Zunic
- Frank Nielsen
- Alexandr Andoni
- Jean Diatta
- Leonidas J. Guibas
- Richard J. Hathaway
- Kai Ming Ting
- Remco C. Veltkamp
- Andrea Torsello
- Juraj Hromkovic
- Daniel Cohen-Or
Venues
- CoRR
- Pattern Recognit. Lett.
- Pattern Recognit.
- IEEE Access
- Inf. Sci.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- ICASSP
- J. Intell. Fuzzy Syst.
- Expert Syst. Appl.
- Bioinform.
- BMC Bioinform.
- Discret. Math.
- ICIP
- Neurocomputing
- Discret. Appl. Math.
- FUZZ-IEEE
- Sensors
- IJCNN
- Theor. Comput. Sci.
- Multim. Tools Appl.
- IEEE Trans. Inf. Theory
- CVPR
- Fuzzy Sets Syst.
- Algorithmica
- INTERSPEECH
- NeurIPS
- Eur. J. Oper. Res.
- SODA
- Int. J. Intell. Syst.
- Appl. Soft Comput.
- ICRA
- SISAP
- AAAI
- SMC
- ICDM
- Entropy
- Discret. Comput. Geom.
- Comput. Vis. Image Underst.
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