Test Generation and Fault Localization for Quantum Circuits.
Marek A. PerkowskiJacob D. BiamonteMartin LukacPublished in: ISMVL (2005)
Keyphrases
- fault localization
- test generation
- software testing
- quantum computing
- logic circuits
- test cases
- program understanding
- quality assurance
- software development
- software engineering
- regression testing
- software systems
- fault detection
- databases
- model based diagnosis
- static analysis
- decision making
- data abstraction
- information systems
- cooperative