EPML: Expanded Parts Based Metric Learning for Occlusion Robust Face Verification.
Gaurav SharmaFrédéric JuriePatrick PérezPublished in: ACCV (4) (2014)
Keyphrases
- face verification
- metric learning
- labeled faces in the wild
- distance metric
- face recognition
- distance metric learning
- face detection
- illumination variations
- partial occlusion
- semi supervised
- distance function
- learning tasks
- dimensionality reduction
- multi task
- pairwise
- database
- object tracking
- semi supervised learning
- euclidean distance
- labeled data
- appearance model
- data points
- feature space
- pattern recognition
- image processing