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On a Logical Fault Model H1SGLF for Enhancing Defect Coverage.

Junzhi SangTsuyoshi ShinogiHaruhiko TakaseTerumine Hayashi
Published in: Asian Test Symposium (1998)
Keyphrases
  • fault model
  • safety analysis
  • fault injection
  • model based diagnosis
  • fault models
  • defect detection
  • test suite