On the Effect of Stuck-at Faults on Delay-insensitive Nanoscale Circuits.

Jia Di Parag K. Lala Dilip P. Vasudevan

Published in: DFT (2005)

Keyphrases

delay insensitive
asynchronous circuits
low power
databases
fault diagnosis
abnormal events
information systems
decision making
fault detection
multiple faults