Test Generation for Highly Sequential Scan-Testable Circuits Through Logic Transformation.

M. Ray Mercer Vishwani D. Agrawal Carlos M. Roman

Published in: ITC (1981)

Keyphrases

test generation
test cases
sequential scan
similarity search
static analysis
knn
subsequence matching
index structure
machine learning
similarity queries
quality assurance
software testing
circuit design
error rate
feature selection
disk access
neural network