SEQUENTIAL SCAN
Experts
- Ge Yu
- Jae-Woo Chang
- Rui Zhang
- Michael A. Schuh
- Zhefan Zhong
- Themis Palpanas
- Yu Gu
- Rafal A. Angryk
- Xin Lin
- Ziqiang Yu
- Yu Li
- Hans-Peter Kriegel
- Wenjie Zhang
- Jianzhong Qi
- Chuanwen Li
- Peer Kröger
- Liang He
- Tim Wylie
- Spiros Skiadopoulos
- Feifei Li
- Shu-Yu Fu
- Xiaoye Miao
- John Pfeifer
- Reza Akbarinia
- Boseon Yu
- Jiafeng Hu
- Matthias Renz
- Suomi Kobayashi
- Joachim Gudmundsson
- Kun Yue
- Andrew McCallum
- Changqing Ji
- Jonathan Montaño
- Dimitrios Skoutas
- Zheng Li
- Jie Xu
- Jun Wei
- Jun Adachi
- Piyush Kumar
Venues
- CoRR
- IEEE Trans. Knowl. Data Eng.
- ICDE
- Proc. VLDB Endow.
- Knowl. Inf. Syst.
- CIKM
- SISAP
- WAIM
- IEICE Trans. Inf. Syst.
- Frontiers Comput. Sci.
- Inf. Syst.
- EDBT
- GeoInformatica
- VLDB J.
- SIGMOD Conference
- BigComp
- SIGSPATIAL/GIS
- Inf. Sci.
- Soft Comput.
- EDBT/ICDT Workshops
- DATESO
- IEEE Access
- Int. J. Cooperative Inf. Syst.
- Fundam. Informaticae
- NPC
- FCC
- ITC
- Remote. Sens.
- DASFAA (1)
- FSKD (5)
- Sensors
- APWeb/WAIM (2)
- IEEE Pacific Rim Conference on Multimedia
- ICHIT (2)
- Distributed Parallel Databases
- SSDBM
- ICNC (2)
- Comput. Syst. Sci. Eng.
- Int. J. Comput. Sci. Appl.
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