SEQUENTIAL SCAN
Experts
- Ge Yu
- Rui Zhang
- Jae-Woo Chang
- Jianzhong Qi
- Chuanwen Li
- Themis Palpanas
- Zhefan Zhong
- Tim Wylie
- Peer Kröger
- Ziqiang Yu
- Michael A. Schuh
- Xin Lin
- Rafal A. Angryk
- Hans-Peter Kriegel
- Liang He
- Yu Li
- Wenjie Zhang
- Yu Gu
- Michael Horton
- Hiroaki Shiokawa
- Jiafeng Hu
- Jeff M. Phillips
- Kun Ma
- Christian S. Jensen
- Daiji Fukagawa
- Jingwen Cai
- Peter Kunath
- Ying Zhang
- Matthias Renz
- Arnab Bhattacharya
- Rob Fergus
- Catarina Moreira
- Nishant Yadav
- Hua Zhong
- Shohei Matsugu
- Xiaoye Miao
- Zheng Li
- Wen-Chih Peng
- Parth Nagarkar
Venues
- CoRR
- IEEE Trans. Knowl. Data Eng.
- ICDE
- Proc. VLDB Endow.
- Knowl. Inf. Syst.
- CIKM
- SISAP
- WAIM
- IEICE Trans. Inf. Syst.
- Inf. Sci.
- IEEE Access
- Inf. Syst.
- DATESO
- BigComp
- EDBT/ICDT Workshops
- Frontiers Comput. Sci.
- EDBT
- SIGMOD Conference
- GeoInformatica
- SIGSPATIAL/GIS
- VLDB J.
- Soft Comput.
- ICS
- J. Chem. Inf. Model.
- FSKD (5)
- ICCCNT
- Theory Comput. Syst.
- APWeb/WAIM (2)
- ICCSA (3)
- IEEE Trans. Instrum. Meas.
- J. Electronic Imaging
- FLAIRS Conference
- ACM Comput. Surv.
- FCC
- ISVC (1)
- SEBD
- IDEAL
- Fundam. Informaticae
- DASFAA (1)
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