SEQUENTIAL SCAN
Experts
- Rui Zhang
- Ge Yu
- Jae-Woo Chang
- Michael A. Schuh
- Tim Wylie
- Peer Kröger
- Ziqiang Yu
- Chuanwen Li
- Themis Palpanas
- Zhefan Zhong
- Jianzhong Qi
- Wenjie Zhang
- Yu Gu
- Hans-Peter Kriegel
- Liang He
- Yu Li
- Rafal A. Angryk
- Xin Lin
- Suprio Ray
- Wonik Choi
- Reza Akbarinia
- Shu-Yu Fu
- Wang-Chien Lee
- Zhao Chang
- Feifei Li
- Zhiguo Gong
- Reynold Cheng
- Man Lung Yiu
- Xuan Song
- Atsuhiro Takasu
- Xiaoyang Chen
- Hongwei Huo
- John Pfeifer
- Nicholas Monath
- Johannes Aßfalg
- Chuan-Ming Liu
- Kostas Patroumpas
- Jonathan Montaño
- Omid Jafari
Venues
- CoRR
- IEEE Trans. Knowl. Data Eng.
- ICDE
- Proc. VLDB Endow.
- Knowl. Inf. Syst.
- CIKM
- SISAP
- WAIM
- IEICE Trans. Inf. Syst.
- Inf. Sci.
- IEEE Access
- Inf. Syst.
- DATESO
- EDBT/ICDT Workshops
- BigComp
- Frontiers Comput. Sci.
- EDBT
- SIGMOD Conference
- GeoInformatica
- SIGSPATIAL/GIS
- VLDB J.
- Soft Comput.
- J. Chem. Inf. Model.
- ICS
- ICCCNT
- Theory Comput. Syst.
- FSKD (5)
- IEEE Trans. Instrum. Meas.
- APWeb/WAIM (2)
- ICCSA (3)
- J. Electronic Imaging
- FLAIRS Conference
- ACM Comput. Surv.
- ISVC (1)
- FCC
- SEBD
- IDEAL
- Fundam. Informaticae
- DASFAA (1)
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