A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing.
Yuta YamatoXiaoqing WenKohei MiyaseHiroshi FurukawaSeiji KajiharaPublished in: PRDC (2009)
Keyphrases
- high quality
- experimental evaluation
- synthetic data
- fully automatic
- preprocessing
- detection method
- high accuracy
- genetic algorithm
- optimization method
- high precision
- dynamic programming
- real time
- support vector machine
- significant improvement
- edge detection
- high speed
- test data
- highly accurate
- cost function
- computationally efficient
- optimization algorithm
- training set
- computational complexity
- classification method
- objective function
- face recognition