The Impact of Inductance on Transients Affecting Gate Oxide Reliability.

N. S. Nagaraj William R. Hunter Poras T. Balsara Cyrus D. Cantrell

Published in: VLSI Design (2005)

Keyphrases

leakage current
data mining
learning algorithm
database systems
highly reliable
field effect transistors
silicon dioxide
data sets
neural network
e learning
multi agent
information technology
multi channel
reliability assessment
fuel cell
metal oxide