A Novel Method for the Determination of Electromigration-Induced Void Nucleation Stresses.
J. Shuster-PassageS. Abdel RazekM. MattooMeike HauschildtSeungman ChoiMartin GallArmen KteyanJun-Ho ChoyValeriy SukharevMatthias KraatzJ. R. LloydPublished in: IRPS (2024)
Keyphrases
- main contribution
- high accuracy
- cost function
- similarity measure
- experimental study
- multiresolution
- error rate
- evaluation method
- detection method
- theoretical analysis
- computational cost
- prior knowledge
- detection algorithm
- clustering method
- preprocessing
- energy function
- statistical model
- high precision
- fully automatic
- data sets