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Untestable Multi-Cycle Path Delay Faults in Industrial Designs.
Manan Syal
Michael S. Hsiao
Suriyaprakash Natarajan
Sreejit Chakravarty
Published in:
Asian Test Symposium (2005)
Keyphrases
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fault detection
fault diagnosis
industrial applications
shortest path
critical path
quality improvement
test cases
industrial processes
genetic algorithm
artificial intelligence
information systems
knowledge base
expert systems
wireless sensor networks
destination node