Gate Dielectric.

Zeyang Ren Qi He Jiamin Xu Guansheng Yuan Jinfeng Zhang Jincheng Zhang Kai Su Yue Hao

Published in: IEEE Access (2020)

Keyphrases

silicon dioxide
gate dielectrics
leakage current
electrical properties
nano scale
high temperature
multiple input
databases
artificial neural networks
markov chain
expert systems
feature extraction
case study
knowledge base
information systems
computer vision
real time