Introduction to the PAMI Special Issue on Industrial Machine Vision and Computer Vision Technology-Part II.
Jorge L. C. SanzPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (1988)
Keyphrases
- machine vision
- special issue
- computer vision
- surface inspection
- vision system
- image processing
- automated visual inspection
- character recognition
- ai edam
- ecml pkdd
- international journal
- quality control
- technology transfer
- imaging systems
- special section
- image analysis
- object recognition
- applied intelligence
- surface defects
- machine learning
- computer science
- information systems