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1-D probe array for ACFM inspection of large metal plates.

Dariush Mirshekar-SyahkalReza F. Mostafavi
Published in: IEEE Trans. Instrum. Meas. (2002)
Keyphrases
  • programmable logic
  • quality control
  • automatic inspection
  • databases
  • visual inspection
  • neural network
  • defect detection
  • data sets
  • high speed
  • grain size
  • number plate recognition