DCP-Net: The Defect Detection Method of Industrial Product based on Dual Collaborative Paths.

Zekai Zhang Mingle Zhou Honglin Wan Min Li Gang Li

Published in: IJCNN (2023)

Keyphrases

detection method
detection algorithm
face detection
industrial applications
automated visual inspection
feature detection
region detection
collaborative learning
shortest path
computer vision
three dimensional
life cycle
face detector
defect detection