Experimental Insights Into Thermal Dissipation in TSV-Based 3-D Integrated Circuits.
Perceval CoudrainPapa Momar SouareRafael PrietoVincent FioriAlexis FarcyLaurent Le-PailleurJean-Philippe ColonnaCristiano SantosPascal VivetM. Haykel Ben JamaaDenis DutoitFrançois de CrecySylvain DumasChristian ChancelDidier LattardSéverine CheramyPublished in: IEEE Des. Test (2016)