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A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects.

Haihua YanAdit D. Singh
Published in: VLSI Design (2005)
Keyphrases
  • power dissipation
  • high speed
  • test cases
  • low power
  • power consumption
  • test data
  • integrated circuit
  • built in self test
  • knowledge base
  • real time
  • model based diagnosis
  • defect detection