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On-Chip Stimulus Generator for Gain, Linearity, and Blocking Profile Test of Wideband RF Front Ends.
Rashad Ramzan
N. Ahsan
Jerzy J. Dabrowski
Published in:
IEEE Trans. Instrum. Meas. (2010)
Keyphrases
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high speed
data generator
frequency band
radio frequency
low cost
signal to noise ratio
high density
real time
neural network
test cases
test data
statistical tests
statistical significance
physical design
programmable logic
random access memory