New Methodology for Evaluating Minority Carrier Lifetime for Process Assessment.

Kuniyuki Kakushima Takuya Hoshii M. Watanabe N. Shizyo K. Furukawa Takuya Saraya T. Takakura K. Itou M. Fukui S. Suzuki Ken Takeuchi Iriya Muneta Hitoshi Wakabayashi Y. Numasawa Atsushi Ogura Shinichi Nishizawa Kazuo Tsutsui Toshiro Hiramoto H. Ohashi Hiroshi Iwai

Published in: VLSI Circuits (2018)

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