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Intrinsic response extraction for the removal of the parasiticeffects in analog test buses.

Chauchin SuYue-Tsang Chen
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
  • databases
  • analog vlsi
  • data mining
  • feature selection
  • image processing
  • evolutionary algorithm
  • signal processing
  • test cases
  • automatic extraction
  • test suite
  • digital circuits