Annealing-based heuristics and genetic algorithms for circuit partitioning in parallel test generation.
Consolación GilJulio Ortega LoperaAntonio F. DíazMaria Dolores Gil MontoyaPublished in: Future Gener. Comput. Syst. (1998)
Keyphrases
- test generation
- genetic algorithm
- simulated annealing
- test cases
- parallel genetic algorithms
- symbolic execution
- test sequences
- design automation
- parallel genetic algorithm
- quality assurance
- search heuristics
- search algorithm
- test data generation
- software testing
- static analysis
- simulated annealing and tabu search
- circuit design
- parallel processing
- high speed
- evolutionary algorithm
- neural network
- data sets
- artificial intelligence
- image quality
- machine learning
- mutation testing