Grand Challenges in Printed Circuit Board Defect Detection Based on Image Processing.

Mary Jane Samonte Chuanxiang Du Xiaomian Li Xiaoyan Wei

Published in: ICBDC (2023)

Keyphrases

defect detection
printed circuit boards
image processing
grand challenges
feature extraction
grand challenge

visual inspection
mid term
technology enhanced learning
machine vision
automated visual inspection
pattern recognition

computer graphics
integrated circuit
computer vision
image analysis
manufacturing process

recent advances
control system
image segmentation
artificial intelligence
tv camera