Grand Challenges in Printed Circuit Board Defect Detection Based on Image Processing.
Mary Jane SamonteChuanxiang DuXiaomian LiXiaoyan WeiPublished in: ICBDC (2023)
Keyphrases
- defect detection
- printed circuit boards
- image processing
- grand challenges
- feature extraction
- grand challenge
- visual inspection
- mid term
- technology enhanced learning
- machine vision
- automated visual inspection
- pattern recognition
- computer graphics
- integrated circuit
- computer vision
- image analysis
- manufacturing process
- recent advances
- control system
- image segmentation
- artificial intelligence
- tv camera