Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure Based On Interlayer Diffusion.
Zhikuan ChenYufeng SunYuqing XuePublished in: DSA (2023)
Keyphrases
- reliability analysis
- thin film
- inter layer
- room temperature
- power plant
- single layer
- multi layer
- high density
- short circuit
- scalable video coding
- solar cell
- base layer
- white light interferometry
- condition monitoring
- survival analysis
- rate distortion
- fault diagnosis
- optimization model
- inter frame
- optical flow
- multiresolution
- neural network