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Challenges of In-Situ Thermal Characterization of Thin-Film Isolation Layers for Printed Electronics.
Harald Steiner
Thilo Sauter
Marlies Schlauf
Thomas Schalkhammer
Roman Fuhringer
Dietmar Kieslinger
Published in:
ISIE (2018)
Keyphrases
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thin film
multi layer
room temperature
lessons learned
short circuit
high density
solar cell
databases
infrared
electron microscopy
grain size
machine learning
decision support system
high temperature
plasma etching
electrical engineering
optical character recognition
genetic algorithm
real world
neural network