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Minimizing the Number of Test Configurations for Different FPGA Families.

Michel RenovellJean-Michel PortalJoan FiguerasYervant Zorian
Published in: Asian Test Symposium (1999)
Keyphrases
  • small number
  • data sets
  • computational complexity
  • information systems
  • e learning
  • signal processing
  • test data
  • maximum number