C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
Minimizing the Number of Test Configurations for Different FPGA Families.
Michel Renovell
Jean-Michel Portal
Joan Figueras
Yervant Zorian
Published in:
Asian Test Symposium (1999)
Keyphrases
</>
small number
data sets
computational complexity
information systems
e learning
signal processing
test data
maximum number