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Quality Control of Delay-Doppler Maps for Stare Processing.
Giuseppe Grieco
Ad Stoffelen
Marcos Portabella
Maria Belmonte Rivas
Wenming Lin
Fran Fabra
Published in:
IEEE Trans. Geosci. Remote. Sens. (2019)
Keyphrases
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quality control
machine vision
quality assurance
automated visual inspection
data processing
real time
manufacturing systems
product quality
machine learning
quality improvement
manufacturing process
computer aided
monitoring system
vision system
signal processing
episodic memory
image processing
surface inspection